About this scholarly article

Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator by Lee, Donggun ;Park, Jun-Woo ;Cho, Nam-Kwang ;Lee, Jinwon ;Kim, Youn Sang is a scholarly article available to read on EtoBox.

Author

Lee, Donggun ;Park, Jun-Woo ;Cho, Nam-Kwang ;Lee, Jinwon ;Kim, Youn Sang

Publisher

Springer Science and Business Media LLC; London: Nature Publishing Group; [London]: Springer Nature; Nature Publishing Group; Society for Mining, Metallurgy and Exploration Inc.; Research Square; Springer Nature; Island Press (ISSN 2045-2322)

Published

2019