Opening book details…
About this Materials Science article
Tuning the electrical performance of Ge nanowire MOSFETs by focused ion beam implantation by Burchhart, T; Zeiner, C; Lugstein, A; Henkel, C; Bertagnolli, E is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Burchhart, T; Zeiner, C; Lugstein, A; Henkel, C; Bertagnolli, E
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
- Published
- 2010
- Field
- Materials Science (Physical Sciences)