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About this Engineering article
Analysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution by Takeuchi, Teruaki; Tatsumura, Kosuke; Shimura, Takayoshi; Ohdomari, Iwao is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Takeuchi, Teruaki; Tatsumura, Kosuke; Shimura, Takayoshi; Ohdomari, Iwao
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 2016
- Field
- Engineering (Physical Sciences)
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