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Capacitance-Voltage (C-V) Characterization of Semiconductors by Kaufmann, Elton N. is a scholarly article available to read on EtoBox.

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"A thoroughly updated and expanded new edition, this work features a logical, detailed, and self-contained coverage of the latest materials characterization techniques. Reflecting the enormous progress in the field since the last edition, this book details a variety of new powerful and accessible tools, improvements in methods arising from new instrumentation and approaches to sample preparation, and characterization techniques for new types of materials, such as nanomaterials. Researchers in materials science and related fields will be able to identify and apply the most appropriate method in their work"-- Provided by publisher

Author

Kaufmann, Elton N.

Publisher

John Wiley & Sons, Incorporated

Published

2012

Language

EN

ISBN

9780471268826