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This document reviews advancements in atomic force microscopy (AFM), particularly in ultra-high vacuum environments, highlighting the development of frequency modulation AFM (FM-AFM) which allows for atomic resolution imaging of both conductors and insulators. The article discusses the principles of AFM, its relation to scanning tunneling microscopy (STM), and the challenges faced in achieving atomic resolution. It also covers the evolution of AFM techniques and their applications in surface science, emphas

Author

tuantntnt12

Language

EN