Opening book details…
About this Engineering article
In situ TEM study of the amorphous-to-crystalline transition during dielectric breakdown in TiO2 film by Tian, Xinchun; Cook, Chloe; Hong, Wei; Ma, Tao; Brennecka, Geoff Lee; Tan, Xiaoli is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tian, Xinchun; Cook, Chloe; Hong, Wei; Ma, Tao; Brennecka, Geoff Lee; Tan, Xiaoli
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1944-8244)
- Published
- 2019
- Language
- EN
- Field
- Engineering (Physical Sciences)