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About this Engineering article
An Electron-microscope-based System for Accurate Microdimensional Measurements by D.A. Swyt; S.W. Jensen is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- D.A. Swyt; S.W. Jensen
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0141-6359)
- Published
- 1981
- Language
- EN
- Field
- Engineering (Physical Sciences)