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About this Engineering article
Probabilistic Design Approach for Cyclic Fatigue Life Prediction of Microelectronic Interconnects by Ladani, L.J.; Razmi, J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Ladani, L.J.; Razmi, J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1521-3323)
- Published
- 2010
- Language
- EN
- Field
- Engineering (Physical Sciences)