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About this Engineering article
Kink Effect in AlGaN/GaN HEMTs Induced by Drain and Gate Pumping by Wang, Maojun; Chen, Kevin J. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wang, Maojun; Chen, Kevin J.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)