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X-Ray Diffraction: Principles and Applications by Alka Tirkey is a document available to read on EtoBox.

The material was analyzed using XRD. Several peaks in the diffraction pattern corresponded to different crystal planes, which were used to determine the lattice parameters and symmetry of the crystal structure. The complex crystal structure contained multiple phases and significant disorder. The results suggest applications in electronic and optical devices due to unique structure and properties. Overall, the study demonstrates how XRD can be used to investigate the structure of complex materials.

Author

Alka Tirkey

Language

EN