About this scholarly article

ROCS Workshop, 2005. - Indian Wells, CA, USA (2005.10.30-2005.10.30)] [Reliability of Compound Semiconductors] ROCS Workshop, 2005. - Full band ensemble monte carlo simulations for reliability investigation of highvoltage single & double heterojunction bipolar transistors for military and base station applications including a proposed high breakdown composite collector design by Madra, S. is a scholarly article available to read on EtoBox.

Author

Madra, S.

Publisher

IEEE

Published

2005