About this Engineering article
Parameter extraction of accurate and scaleable substrate resistance components in RF MOSFETs by Yuhua Cheng; M. Matloubian is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Yuhua Cheng; M. Matloubian
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0741-3106)
- Published
- 2002
- Language
- EN
- Field
- Engineering (Physical Sciences)