About this scholarly article

2009 International Semiconductor Device Research Symposium - Performance analysis of nonvolatile gate-all-around charge-trapping TAHOS memory cells by Gnani, E.; Gnudi, A.; Reggiani, S.; Baccarani, G.; Fu, J.; Singh, N.; Lo, G.Q.; Kwong, D.L. is a scholarly article available to read on EtoBox.

Author

Gnani, E.; Gnudi, A.; Reggiani, S.; Baccarani, G.; Fu, J.; Singh, N.; Lo, G.Q.; Kwong, D.L.

Publisher

IEEE

Published

2009