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About this Engineering article
Investigating the impact of the defect dynamic characteristics on the PBTI in the high- κ gate device by Liu, Xianqiang; Xu, Xiaodi; Gu, Chenjie; Gu, Renyuan; Wang, Weiwei; Liu, Wenjun; Duan, Tianli is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Liu, Xianqiang; Xu, Xiaodi; Gu, Chenjie; Gu, Renyuan; Wang, Weiwei; Liu, Wenjun; Duan, Tianli
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2018
- Field
- Engineering (Physical Sciences)