About this scholarly article

24th IEEE VLSI Test Symposium - Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing by Stratigopoulos, H.-G.D.; Makris, Y. is a scholarly article available to read on EtoBox.

Author

Stratigopoulos, H.-G.D.; Makris, Y.

Publisher

IEEE

Published

2006

Language

EN