About this scholarly article

Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159) - Analysis of failure sources in surface-micromachined MEMS by Deb, N.; Blanton, R.D. is a scholarly article available to read on EtoBox.

Author

Deb, N.; Blanton, R.D.

Publisher

Int. Test Conference

Published

2000

Language

EN