About this scholarly article

SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Sunday 21 June 2015)] Automated Visual Inspection and Machine Vision - Object recognition in 3D point clouds with maximum likelihood estimation by Beyerer, Jürgen; Puente León, Fernando; Dantanarayana, Harshana G.; Huntley, Jonathan M. is a scholarly article available to read on EtoBox.

Author

Beyerer, Jürgen; Puente León, Fernando; Dantanarayana, Harshana G.; Huntley, Jonathan M.

Publisher

SPIE

Published

2015

Language

EN