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About this Engineering article
Ellipsometry of the liquid-vapor interface close to the critical point: A theoretical analysis by D. Bedeaux; E. M. Blokhuis; J. W. Schmidt is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- D. Bedeaux; E. M. Blokhuis; J. W. Schmidt
- Publisher
- Springer; Springer-Verlag; Kluwer Academic/Plenum Publishers; Springer Science and Business Media LLC (ISSN 0195-928X)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)
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