About this scholarly article

2009 27th IEEE VLSI Test Symposium - Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths by Ma, Junxia; Lee, Jeremy; Tehranipoor, Mohammad is a scholarly article available to read on EtoBox.

Author

Ma, Junxia; Lee, Jeremy; Tehranipoor, Mohammad

Publisher

IEEE

Published

2009

Language

EN