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About this Engineering article

Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials by Tian, H. H.; Atzmon, M. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Tian, H. H.; Atzmon, M.
Publisher
Taylor and Francis Group; Informa UK (Taylor & Francis); Taylor & Francis; Informa UK Limited (ISSN 0141-8610)
Published
1999
Field
Engineering (Physical Sciences)

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