Skip to content

Opening book details…

About this Engineering article

Simple reflection Scanning Near-field Optical Microscope using the back reflected light inside the laser cavity as detection mode by U Schwarz; M.L Berthié; D Courjon; H Bielefeldt is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
U Schwarz; M.L Berthié; D Courjon; H Bielefeldt
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0030-4018)
Published
1997
Language
EN
Field
Engineering (Physical Sciences)

More by U Schwarz; M.L Berthié; D Courjon; H Bielefeldt

Browse all works by U Schwarz; M.L Berthié; D Courjon; H Bielefeldt