About this scholarly article

2018 IEEE Asian Solid-State Circuits Conference (A-SSCC) - A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process by Igarashi, Mitsuhiko; Uchida, Yuuki; Takazawa, Yoshio; Tsukamoto, Yasumasa; Shibutani, Koji; Nii, Koji is a scholarly article available to read on EtoBox.

Author

Igarashi, Mitsuhiko; Uchida, Yuuki; Takazawa, Yoshio; Tsukamoto, Yasumasa; Shibutani, Koji; Nii, Koji

Publisher

IEEE

Published

2018

Language

EN