About this scholarly article

2000 IEEE Nuclear Science Symposium. Conference Record (Cat. No.00CH37149) - A large dynamic range radiation tolerant analog memory in a quarter micron CMOS technology by Anelli, G.; Anghinolfi, F.; Rivetti, A. is a scholarly article available to read on EtoBox.

Author

Anelli, G.; Anghinolfi, F.; Rivetti, A.

Publisher

IEEE

Published

2000

Language

EN