About this scholarly article

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 29 April 2013)] Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences - A Large range metrological atomic force microscope and its uncertainty analysis by Gao, S.; Li, Q.; Li, W.; Lu, M.; Shi, Y.; Postek, Michael T.; Newbury, Dale E.; Platek, S. Frank; Maugel, Tim K. is a scholarly article available to read on EtoBox.

Author

Gao, S.; Li, Q.; Li, W.; Lu, M.; Shi, Y.; Postek, Michael T.; Newbury, Dale E.; Platek, S. Frank; Maugel, Tim K.

Publisher

SPIE

Published

2013