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Content: METHODS AND PHENOMENA THEIR APPLICATIONS IN SCIENCE AND TECHNOLOGY , Page ii Front Matter , Page iii Copyright , Page iv CONTRIBUTORS TO VOLUME 1 , Page v METHODS AND PHENOMENA , Page vi PREFACE , Page vii , S.P. Wolsky, A.W. Czanderna INTRODUCTION , Pages 1-4 , A.W. CZANDERNA Chapter 1 - THE ASPECTS OF SPUTTERING IN SURFACE ANALYSIS METHODS , Pages 5-37 , G.K. WEHNER Chapter 2 - A COMPARISON OF THE METHODS OF SURFACE ANALYSIS AND THEIR APPLICATIONS , Pages 39-73 , D. LICHTMAN Chapter 3 - LOW-ENERGY ION SCATTERING SPECTROMETRY , Pages 75-102 , T.M. BUCK Chapter 4 - SURFACE ANALYSIS BY X-RAY PHOTOELECTRON SPECTROSCOPY , Pages 103-158 , W.M. RIGGS, M.J. PARKER Chapter 5 - AUGER ELECTRON SPECTROSCOPY , Pages 159-222 , A. JOSHI, L.E. DAVIS, P.W. PALMBERG Chapter 6 - SECONDARY ION MASS SPECTROMETRY , Pages 223-278 , J.A. McHUGH Chapter 7 - THE USE OF AUGER ELECTRON SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY IN THE MICROELECTRONIC TECHNOLOGY , Pages 279-328 , J.M. MORABITO, R.K. LEWIS Chapter 8 - THE ATOM-PROBE FIELD ION MICROSCOPE , Pages 329-378 , E.W. MÜLLER Chapter 9 - FIELD ION MASS SPECTROMETRY APPLIED TO SURFACE INVESTIGA

Who reads Methods of surface analysis. 1, Methods and phenomena their applications in science and technology?

Author

A.W. Czanderna (Eds.)

Publisher

Elsevier Scientific Pub. Co.; Elsevier Science Ltd

Published

1975

Language

EN

ISBN

9780444422637

Category

nonfiction

Subjects

Science, Technology, Chemistry