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Studies of Supported Metal Catalysts Using Low Voltage Biased Secondary Electron Imaging in a JSM-6320f Fe-SEM by J. Liu; R. L. Ornberg; J. R. Ebner is a Materials Science article available to read on EtoBox.
What is Studies of Supported Metal Catalysts Using Low Voltage Biased Secondary Electron Imaging in a JSM-6320f Fe-SEM about?
Many industrial catalysts have a complex geometric structure to enable reacting gases or fluids to reach as much of the active surface of the catalyst as possible. The catalyzing surface frequently consists of a complex chemical mixture of different phases produced by an evolved chemical process. The active components are often very small particles dispersed on high-surface-area supports. The catalytic properties of this type of catalyst depend on the structure, composition, and morphology of the active species as well as the supports. TEM/STEM and associated techniques have been used extensively to characterize the structure and composition of supported catalysts. Surface morphology of supported catalysts is generally examined by secondary electron imaging, especially at low incident beam energies. It is, however, frequently found that small metal particles are not usually seen in SE images because of the complication of support topography
Who reads Studies of Supported Metal Catalysts Using Low Voltage Biased Secondary Electron Imaging in a JSM-6320f Fe-SEM?
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- J. Liu; R. L. Ornberg; J. R. Ebner
- Publisher
- Oxford University Press (OUP)
- Published
- 1997
- Language
- EN
- Field
- Materials Science (Physical Sciences)