About this scholarly article

14th Asian Test Symposium (ATS'05) - Efficient Static Compaction Techniques for Sequential Circuits Based on Reverse Order Restoration and Test Relaxation by El-Maleh, A.H.; Khursheed, S.S.; Sait, S.M. is a scholarly article available to read on EtoBox.

Author

El-Maleh, A.H.; Khursheed, S.S.; Sait, S.M.

Publisher

IEEE

Published

2005

Language

EN