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What is SEM, TEM, STEM, and AFM Comparison about?
SEM, TEM, STEM and AFM are microscopic techniques that use different methods of analysis. SEM uses backscattered and secondary electrons to image external surface morphology at 5nm resolution. TEM images internal microstructural details at 5nm resolution using electrons passing through a sample. STEM uses tunneling current control to generate 3D contour maps of surfaces at 2-0.1nm resolution. AFM detects cantilever deflections through optical means to map 3D surface topography at 2-0.1nm resolution of both
- Author
- Tehreem Fatima
- Language
- EN