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About this Engineering article
Reduction of the Trap Density at the Organic–organic Interface and Resultant Gate-bias Dependency of the Mobility in an Organic Thin-film Transistor by Jin-Hyuk Bae; Yoonseuk Choi is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Jin-Hyuk Bae; Yoonseuk Choi
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0038-1101)
- Published
- 2012
- Field
- Engineering (Physical Sciences)