About this scholarly article

Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996 - Localization and identification of microscopic defects leading to locally enhanced currents across pn-junctions of solar cells by Voigt, A.; Gobel, T.; Strunk, H.P.; Hassler, C.; Koch, W.; Karg, D.; Pensl, G. is a scholarly article available to read on EtoBox.

Author

Voigt, A.; Gobel, T.; Strunk, H.P.; Hassler, C.; Koch, W.; Karg, D.; Pensl, G.

Publisher

IEEE

Published

1996