Opening book details…
About this nonfiction
Machine Learning Based Device Simulation Using Multi-variable Non-linear Regression to Assess the Impact of Device Parameter Variability on Threshold Voltage of Double Gate-All-Around (DGAA) MOSFET by Moparthi, Sandeep (author);Yadav, Chandan (author);Saramekala, Gopi Krishna (author);Tiwari, Pramod Kumar (author) is a nonfiction available to read on EtoBox.
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Moparthi, Sandeep (author);Yadav, Chandan (author);Saramekala, Gopi Krishna (author);Tiwari, Pramod Kumar (author)
- Publisher
- IEEE
- Published
- 2020
- Language
- EN
- Category
- nonfiction
More by Moparthi, Sandeep (author);Yadav, Chandan (author);Saramekala, Gopi Krishna (author);Tiwari, Pramod Kumar (author)
Similar books
- Dual-gate Low-voltage Transparent Electric-double-layer Thin-film Transistors with a Top Gate for Threshold Voltage Modulation — Wei Dou & Yuanyuan Tan
- Material and Device Structure Designs for 2D Memory Devices Based on the Floating Gate Voltage Trajectory
- 2021 International Symposium on Devices, Circuits and Systems (ISDCS) — Moparthi, Sandeep; Tiwari, Pramod Kumar; Saramekala, Gopi Krishna (2021)
- 2021 4th International Conference on Electron Device and Mechanical Engineering (ICEDME) — Liu, Yunong; Guo, Chunsheng; Guo, Hao; Wei, Lei (2021)
- 2020 IEEE 9th International Power Electronics and Motion Control Conference (IPEMC2020-ECCE Asia) — Wang, Xiang; Wu, Haimeng; Pickert, Volker (2020)
- 2020 IEEE International Integrated Reliability Workshop (IIRW) — Stockman, Arno; Moens, Peter (2020)