Skip to content

Opening book details…

About this scholarly article

ECS Transactions - Influence of the N-Type FinFET Width on the Zero Temperature Coefficient by Bellodi, M.; Martino, Joao A.; Camillo, L. M.; Simoen, E.; Claeys, C. is a scholarly article available to read on EtoBox.

Author
Bellodi, M.; Martino, Joao A.; Camillo, L. M.; Simoen, E.; Claeys, C.
Publisher
ECS
Published
2007

More by Bellodi, M.; Martino, Joao A.; Camillo, L. M.; Simoen, E.; Claeys, C.

Browse all works by Bellodi, M.; Martino, Joao A.; Camillo, L. M.; Simoen, E.; Claeys, C.