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About this Materials Science article
Defect Scaling with Contact Area in EGaIn-Based Junctions: Impact on Quality, Joule Heating, and Apparent Injection Current by Jiang, Li; Sangeeth, C. S. Suchand; Wan, Albert; Vilan, Ayelet; Nijhuis, Christian A. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Jiang, Li; Sangeeth, C. S. Suchand; Wan, Albert; Vilan, Ayelet; Nijhuis, Christian A.
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1932-7447)
- Published
- 2015
- Field
- Materials Science (Physical Sciences)