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19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Aliasing analysis of spectral statistical response compaction techniques by Khan, O.I.; Bushnell, M.L. is a scholarly article available to read on EtoBox.

Author
Khan, O.I.; Bushnell, M.L.
Publisher
IEEE
Published
2006

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