About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Neutron Optics and Sources - Matching bent crystals to high-brilliance sources by Popovici, Mihai; Stoica, Alexandru D.; MacDonald, Carolyn A.; Goldberg, Kenneth A.; Maldonado, Juan R.; Chen-Mayer, Huaiyu H.; Vernon, Stephen P. is a scholarly article available to read on EtoBox.

Author

Popovici, Mihai; Stoica, Alexandru D.; MacDonald, Carolyn A.; Goldberg, Kenneth A.; Maldonado, Juan R.; Chen-Mayer, Huaiyu H.; Vernon, Stephen P.

Publisher

SPIE

Published

1999