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About this Engineering article
Self-heating aware EM reliability prediction of advanced CMOS technology by kinetic Monte Carlo method by Cai, Linlin; Chen, Wangyong; Huang, Peng; Liu, Xiaoyan; Zhao, Yudi; Zhang, Xing is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Cai, Linlin; Chen, Wangyong; Huang, Peng; Liu, Xiaoyan; Zhao, Yudi; Zhang, Xing
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2020
- Language
- EN
- Field
- Engineering (Physical Sciences)
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