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About this Engineering article
Creep Behavior and Microstructural Stability of Lamellar γ-T1AI (Cr, Mo, Si, B) with Extremely Fine Lamellar Spacing by Schillinger, Wolfram; Zhang, Dezhi; Dehm, Gerhard; Bartels, Arno; Clemens, Helmut is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Schillinger, Wolfram; Zhang, Dezhi; Dehm, Gerhard; Bartels, Arno; Clemens, Helmut
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 2000
- Field
- Engineering (Physical Sciences)