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About this Engineering article
The Structural Characterization of Amorphous Thin Films and Coatings in Their As-deposited State Using X-rays at Shallow Angles of Incidence by Rigden, J. S.; Newport, R. J.; Bushnell-Wye, G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Rigden, J. S.; Newport, R. J.; Bushnell-Wye, G.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP); Research Square (ISSN 0884-2914)
- Published
- 1997
- Field
- Engineering (Physical Sciences)
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