About this scholarly article

ECS Transactions - Electrical Characterization Methodologies for the Assessment of High-k Gate Dielectric Stacks by Young, Chadwin D.; Bersuker, Gennadi; Heh, Dawei; Neugroschel, Arnost; Choi, Rino; Kang, Chang Yong; Tun, Joey; Lee, Byoung Hun is a scholarly article available to read on EtoBox.

Author

Young, Chadwin D.; Bersuker, Gennadi; Heh, Dawei; Neugroschel, Arnost; Choi, Rino; Kang, Chang Yong; Tun, Joey; Lee, Byoung Hun

Publisher

ECS

Published

2007

Language

EN