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About this Engineering article
Thermal resistance modeling in FDSOI transistors with industry standard model BSIM-IMG by Kushwaha, Pragya; Bala Krishna, K.; Agarwal, Harshit; Khandelwal, Sourabh; Duarte, Juan-Pablo; Hu, Chenming; Chauhan, Yogesh Singh is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kushwaha, Pragya; Bala Krishna, K.; Agarwal, Harshit; Khandelwal, Sourabh; Duarte, Juan-Pablo; Hu, Chenming; Chauhan, Yogesh Singh
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd; Elsevier BV (ISSN 0026-2692)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)