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About this Engineering article
Quantifying the Complexity of the Chaotic Intensity of an External-Cavity Semiconductor Laser via Sample Entropy by Li, Nianqiang; Pan, Wei; Xiang, Shuiying; Zhao, Qingchun; Zhang, Liyue; Mu, Penghua is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Li, Nianqiang; Pan, Wei; Xiang, Shuiying; Zhao, Qingchun; Zhang, Liyue; Mu, Penghua
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9197)
- Published
- 2014
- Language
- EN
- Field
- Engineering (Physical Sciences)