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About this Engineering article

Tunnel Field-Effect Transistors: Prospects and Challenges by Avci, Uygar E.; Morris, Daniel H.; Young, Ian A. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Avci, Uygar E.; Morris, Daniel H.; Young, Ian A.
Publisher
Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers Inc.; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 2168-6734)
Published
2015
Language
EN
Field
Engineering (Physical Sciences)