About this scholarly article

Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A new testable design of logic circuits under highly observable condition by Xiaoqing, W.; Tamamoto, H.; Kinoshita, K. is a scholarly article available to read on EtoBox.

Author

Xiaoqing, W.; Tamamoto, H.; Kinoshita, K.

Publisher

IEEE Comput. Soc. Press

Published

1994