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2010 IEEE 16th International On-Line Testing Symposium - Predictive error detection by on-line aging monitoring by Vazquez, J. C.; Champac, V.; Ziesemer, A. M.; Reis, R.; Semiao, J.; Teixeira, I. C.; Santos, M. B.; Teixeira, J. P. is a scholarly article available to read on EtoBox.

Author
Vazquez, J. C.; Champac, V.; Ziesemer, A. M.; Reis, R.; Semiao, J.; Teixeira, I. C.; Santos, M. B.; Teixeira, J. P.
Publisher
IEEE
Published
2010

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