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What is Kelvin Probe Force Microscopy Overview about?

Kelvin probe force microscopy (KPFM) is an atomic force microscopy technique used to measure the surface potential and work function of a material. KPFM detects the surface potential difference between a conductive atomic force microscopy tip and the sample surface when the tip is lifted above the sample. By applying an alternating current voltage to the tip, the tip experiences an electrostatic force with components at the voltage frequency and its second harmonic. By adjusting an offset direct current vol

Author

Raj Tokas

Language

EN