About this scholarly article

2007 IEEE International Test Conference - Low cost automatic mixed-signal board test using IEEE 1149.4 by Sundar, Srividya; Kim, Bruce C.; Byrd, Toby; Toledo, Felipe; Wokhlu, Sudhir; Beskar, Erika; Rousselin, Raul; Cotton, David; Kendall, Gary is a scholarly article available to read on EtoBox.

Author

Sundar, Srividya; Kim, Bruce C.; Byrd, Toby; Toledo, Felipe; Wokhlu, Sudhir; Beskar, Erika; Rousselin, Raul; Cotton, David; Kendall, Gary

Publisher

IEEE

Published

2007