Opening book details…
About this Materials Science article
The Structure and Mass of Heterogeneous Thin Films Measured with Dual Polarization Interferometry and Ellipsometry by Coffey, Paul David; Swann, Marcus Jack; Waigh, Thomas Andrew; Mu, Qingshan; Lu, Jian Ren is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Coffey, Paul David; Swann, Marcus Jack; Waigh, Thomas Andrew; Mu, Qingshan; Lu, Jian Ren
- Publisher
- The Royal Society of Chemistry; Royal Society of Chemistry; Cambridge: RSC Publishing; Royal Society of Chemistry (RSC) (ISSN 2046-2069)
- Published
- 2013
- Field
- Materials Science (Physical Sciences)