About this scholarly article

Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - Characterization of laminar jet impingement cooling in portable computer application by Guarino, J.R.; Manno, V.P. is a scholarly article available to read on EtoBox.

Author

Guarino, J.R.; Manno, V.P.

Publisher

IEEE

Published

2001

Language

EN