About this scholarly article

SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Micro topography of different material surface by solid abrasive lapped… by Tian, Chunlin; Yang, Li; Chen, Yaolong; Yang, Jiandong; Fan, Jingfeng; Kley, Ernst-Bernhard; Li, Rongbin; Zhou, Huawen is a scholarly article available to read on EtoBox.

Author

Tian, Chunlin; Yang, Li; Chen, Yaolong; Yang, Jiandong; Fan, Jingfeng; Kley, Ernst-Bernhard; Li, Rongbin; Zhou, Huawen

Publisher

SPIE

Published

2007

Language

EN