About this scholarly article

SPIE Proceedings [SPIE SPIE Sensing Technology + Applications - Baltimore, Maryland, United States (Monday 20 April 2015)] Dimensional Optical Metrology and Inspection for Practical Applications IV - Geometric and topological feature extraction of linear segments from 2D cross-section data of 3D point clouds by Harding, Kevin G.; Yoshizawa, Toru; Ramamurthy, Rajesh; Harding, Kevin; Du, Xiaoming; Lucas, Vincent; Liao, Yi; Paul, Ratnadeep; Jia, Tao is a scholarly article available to read on EtoBox.

Author

Harding, Kevin G.; Yoshizawa, Toru; Ramamurthy, Rajesh; Harding, Kevin; Du, Xiaoming; Lucas, Vincent; Liao, Yi; Paul, Ratnadeep; Jia, Tao

Publisher

SPIE

Published

2015

Language

EN